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Phase Evolution Analysis During Real-Time Solid-State Chemical Lithiation of Crystalline Thin Window Silicon Membranes Using Low-Loss STEM-EELS Imaging

Published online by Cambridge University Press:  30 July 2021

Vladimir Oleshko
Vladimir Oleshko*
Affiliation:
NIST, Gaithersburg, Maryland, United States

Abstract

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Type
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2728 - 2730
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Oleshko, VP, et al. , Microsc. Microanal. 24 (S1), (2018) 1480; ibid 26 (S2) (2020) 1448.CrossRefGoogle Scholar
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Boniface, M., et al. (2016) Nano Lett. 16, 7381-7388.CrossRefGoogle Scholar
McGehee, W.A., et al. , ACS Nano (2019) 13, 8012-8022CrossRefGoogle Scholar