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Parallel Acquisition of Real and Reciprocal Space Data in Transmission SEM

Published online by Cambridge University Press:  22 July 2022

Peter Denninger ,
Peter Schweizer  and
Erdmann Spiecker
Peter Denninger*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Peter Schweizer
Affiliation:
EMPA, Thun, Switzerland
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
*
*Corresponding authors: peter.denninger@fau.de, erdmann.spiecker@fau.de
*Corresponding authors: peter.denninger@fau.de, erdmann.spiecker@fau.de

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2500 - 2503
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Copyright
Copyright © Microscopy Society of America 2022

References

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Schweizer, P et al. , Ultramicroscopy 213 (2020).10.1016/j.ultramic.2020.112956CrossRefGoogle Scholar
Denninger, P et al. , Microscopy and Microanalysis 27(S1) (2021), p. 2696.Google Scholar
Denninger, P et al. , Microscopy and Microanalysis 27(S1) (2021).Google Scholar
The authors acknowledge funding by the German Research Foundation (DFG) via the Research Training Group GRK 1896 “In situ microscopy with electrons, X-rays and Scanning probes”.Google Scholar