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Out-of-Focus STEM Method for Imaging Misfit Dislocations in a Hetero Interface

Published online by Cambridge University Press:  05 August 2019

Suhyun Kim  and
Joong Jung Kim
Suhyun Kim*
Affiliation:
Memory Analysis Science & Engineering Group, Samsung Electronics, San #16 Hwasung-city, 18448, Korea
Joong Jung Kim
Affiliation:
Memory Analysis Science & Engineering Group, Samsung Electronics, San #16 Hwasung-city, 18448, Korea
*
*Corresponding author: suhyun12.kim@samsung.com

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2158 - 2159
Copyright
Copyright © Microscopy Society of America 2019 

References

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