Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-24T10:58:42.033Z Has data issue: false hasContentIssue false
  • English
  • Français

Origins and Contrast of the Electron Signals at Low Accelerating Voltage and with Energy-Filtering in the FE-SEM for High Resolution Imaging

Published online by Cambridge University Press:  23 September 2015

Hendrix Demers ,
Nicolas Brodusch ,
Patrick Woo  and
Raynald Gauvin
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Patrick Woo
Affiliation:
Hitachi High-Technologies Canada Inc., Toronto, Canada.
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 705 - 706
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Goldstein, J.I., et al, "Scanning Electron Microscopy and X-Ray Microanalysis". Springer, 3rd edition (2003).Google Scholar
[2] Brodusch, N., et al, Microscopy and Microanalysis 20 (2014). pp. 38–39.Google Scholar
[3] Joy, D.C., Journal of Microscopy 208 (2002). pp. 24–34.Google Scholar
[4] Kim, J., etal, Journal of Vacuum Science Technology B 25 (2007). pp. 1771–1775.CrossRefGoogle Scholar