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On the Benefits of Obtaining Surface Topography and Volume Structure Information by Correlative S(T)EM in a Scanning Electron Microscope

Published online by Cambridge University Press:  07 February 2019

Cheng Sun ,
Erich Müller  and
Dagmar Gerthsen
Cheng Sun
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.
Erich Müller
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.
Dagmar Gerthsen
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.

Abstract

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Type
Materials Science (Posters)
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 73 - 74
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Inada, H et al. , Ultramicroscopy 111 (2011), p. 865.Google Scholar
[2]We thank Dr Maria Casapu, Andreas Gremminger, Prof Dirk Grunwaldt (Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute for Technology (KIT)) for providing the Pt/Al2O3 sample.Google Scholar
[3]The authors acknowledge funding from the DFG (Deutsche Forschungsgemeinschaft).Google Scholar