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Observations of Superlattice Reflections Associated with Charge Ordering in Bi0.2Ca0.8MnO3 with an Energy-Filter

Published online by Cambridge University Press:  02 July 2020

Y. Murakami ,
D. Shindo ,
K. Hiraga ,
T. Oikawa  and
M. Kersker
Y. Murakami
Affiliation:
Institute for Advanced Materials Processing, Tohoku University, Sendai, 980-8577, Japan
D. Shindo
Affiliation:
Institute for Advanced Materials Processing, Tohoku University, Sendai, 980-8577, Japan
K. Hiraga
Affiliation:
Institute for Materials Research, Tohoku University, Sendai, 980-8577, Japan
T. Oikawa
Affiliation:
JEOL Ltd., Akishima, Tokyo, 196-0021, Japan
M. Kersker
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA, 01960
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Extract

A perovskite manganese oxide of Bi0.2Ca0.8MnO3 exhibits charge ordering of Mn3+ and Mn4+ ions upon cooling. This is an interesting phenomenon from both academic and practical viewpoints, since the charge ordering is accompanied by significant changes in both electric and magnetic properties of the oxide. Since a difference of scattering amplitudes between Mn3+ and Mn4+ is quite small, charge ordering can be observable as superlattice reflections due to the lattice strain caused by this ordering with an electron diffraction method. However, the background in an electron diffraction pattern, which is mainly caused by plasmon scattering, has hindered a precise investigation of the weak diffuse scattering. The purpose of the present work is to assess an efficiency of an omega-type energy-filter in detailed observations of the weak superlattice reflections associated with the charge ordering.

Specimens of Bi0.2Ca0.8MnO3 were prepared by a conventional ion-milling technique. The critical temperature of charge ordering (TCo) was determined to be 160K by resistivity and magnetization measurements.

Type
Microscopy of Ceramics and Minerals
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 574 - 575
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Bao, W. et al., Phys.Rev.Lett., 78(1997)543.CrossRefGoogle Scholar
2.Murakami, Y. et al., Phys.Rev.B, 55(1997)15043.CrossRefGoogle Scholar