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Observation of Wet Samples Using a Novel Atmospheric Scanning Electron Microscope

Published online by Cambridge University Press:  27 August 2014

Yusuke Ominami ,
Shinsuke Kawanishi ,
Tatsuo Ushiki  and
Sukehiro Ito
Yusuke Ominami
Affiliation:
Hitachi High-Technologies Corporation, 882, Ichige, Hitachinka-shi, Ibaraki-ken, 312-8504, Japan
Shinsuke Kawanishi
Affiliation:
Hitachi High-Technologies Corporation, 882, Ichige, Hitachinka-shi, Ibaraki-ken, 312-8504, Japan
Tatsuo Ushiki
Affiliation:
Niigata University Graduate School of Medical and Dental Sciences, 1-757 Asahimachi-dori, Chuo-ku, Niigata-city, Niigata-ken, 951-9510, Japan
Sukehiro Ito
Affiliation:
Hitachi High-Technologies Corporation, 882, Ichige, Hitachinka-shi, Ibaraki-ken, 312-8504, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1154 - 1155
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Thiberge, S, et al., Rev. of Scientific Instruments, 75,2280 (2004).Google Scholar
[2] Nishiyama, H., et al., Microsc. Microanal., 15 938 (2009).Google Scholar