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A Novel Application of Solids Characterization by Environmental Scanning Electron Microscopy (ESEM) Utilizing a Peltier Stage

Published online by Cambridge University Press:  01 August 2002

R.J. Maxwell  and
J.A. Hanko
R.J. Maxwell
Affiliation:
Trace Analysis, Pharmacia Corporation, 7000 Portage Road, Kalamazoo, MI 49001
J.A. Hanko
Affiliation:
Global Pharmaceutical Sciences, Pharmacia Corporation, 4901 Searle Parkway Skokie, Il 60077

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 136 - 137
Copyright
Copyright © Microscopy Society of America 2002