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Nondestructive, High-Resolution Materials Characterization with the CR-AFM

Published online by Cambridge University Press:  01 August 2005

U Schmidt ,
A Jauss ,
W Ibach ,
K Weishaupt  and
O Hollricher
U Schmidt
Affiliation:
WITec GmbH, Ulm, Germany
A Jauss
Affiliation:
WITec GmbH, Ulm, Germany
W Ibach
Affiliation:
WITec GmbH, Ulm, Germany
K Weishaupt
Affiliation:
WITec GmbH, Ulm, Germany
O Hollricher
Affiliation:
WITec GmbH, Ulm, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 674 - 675
Copyright
© 2005 Microscopy Society of America