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New Scanning Electron Microscope Capable of Observing Cells in Solution

Published online by Cambridge University Press:  26 July 2009

H Nishiyama
Affiliation:
JEOL Ltd
M Suga
Affiliation:
JEOL Ltd
M Koizumi
Affiliation:
JEOL Ltd
S Kitamura
Affiliation:
JEOL Ltd
M Tsuyuki
Affiliation:
JEOL Technics Ltd
Y Ishimori
Affiliation:
JEOL Technics Ltd
T Sato
Affiliation:
JEOL Technics Ltd
T Ogura
Affiliation:
AIST
C Sato
Affiliation:
AIST

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009