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New Insights into the Mechanisms of Ag-induced Layer Exchange from Multimodal In situ Studies in SEM and TEM

Published online by Cambridge University Press:  22 July 2022

Peter Denninger*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Anja Greppmair
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Tim Schwope
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Dominik Drobek
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Moritz Buwen
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Benjamin Apeleo-Zubiri
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Peter Schweizer
Affiliation:
EMPA, Thun, Switzerland
Erdmann Spiecker*
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM), IZNF, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany

Abstract

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Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Copyright
Copyright © Microscopy Society of America 2022

References

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The authors gratefully acknowledge financial support by the German Research Foundation (DFG) via the Research Training Group GRK 1896 “In situ microscopy with electrons, X-rays and Scanning probes”.Google Scholar