Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-18T20:17:36.681Z Has data issue: false hasContentIssue false
  • English
  • Français

The New Atmospheric Scanning Electron Microscope allows in situ observation of dynamic phenomena under atmospheric pressure

Published online by Cambridge University Press:  01 August 2010

M Suga ,
H Nishiyama ,
Y Konyuba ,
Y Watanabe ,
S Iwamatsu ,
D Guarrera  and
C Sato
M Suga
Affiliation:
JEOL Ltd, Japan
H Nishiyama
Affiliation:
JEOL Ltd, Japan
Y Konyuba
Affiliation:
JEOL Engineering Ltd, Japan
Y Watanabe
Affiliation:
Yamagata Research Institute of Technology, Japan
S Iwamatsu
Affiliation:
Yamagata Research Institute of Technology, Japan
D Guarrera
Affiliation:
JEOL USA
C Sato
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 330 - 331
Copyright
Copyright © Microscopy Society of America 2010