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A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research

Published online by Cambridge University Press:  04 August 2017

Sylvia JY Lewis ,
SH Lau ,
Wenbing Yun ,
Benjamin Stripe ,
Alan Lyon ,
David Reynolds ,
Sharon Chen  and
Richard Ian Spink
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Concord, CA USA
SH Lau
Affiliation:
Sigray, Inc. Concord, CA USA
Wenbing Yun
Affiliation:
Sigray, Inc. Concord, CA USA
Benjamin Stripe
Affiliation:
Sigray, Inc. Concord, CA USA
Alan Lyon
Affiliation:
Sigray, Inc. Concord, CA USA
David Reynolds
Affiliation:
Sigray, Inc. Concord, CA USA
Sharon Chen
Affiliation:
Sigray, Inc. Concord, CA USA
Richard Ian Spink
Affiliation:
Sigray, Inc. Concord, CA USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2176 - 2177
Copyright
© Microscopy Society of America 2017 

References

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[1] Pirrie, D, et al., Geology Today 2011). p. 232.Google Scholar
[2] Fogden, A, et al, SCA Proceedings 2014). p. 7.Google Scholar
[3] The authors acknowledge funding from the NSF, Division of Industrial Innovation & Partnerships for the development of x-ray mirror lens (IIP-1448727) and the NIH, National Institute of General Medicine Science for the development of the microstructured source target (GRANT11545218).Google Scholar