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Nanoscale tracking of oxygen diffusion pathways in oxide ion conductors

Published online by Cambridge University Press:  30 July 2021

David Diercks ,
Federico Baiutti ,
Francesco Chiabrera ,
Alex Morata  and
Albert Tarancon
David Diercks
Affiliation:
Colorado School of Mines, Golden, Colorado, United States
Federico Baiutti
Affiliation:
Catalonia Institute for Energy Research (IREC), United States
Francesco Chiabrera
Affiliation:
Catalonia Institute for Energy Research (IREC), United States
Alex Morata
Affiliation:
Catalonia Institute for Energy Research (IREC), United States
Albert Tarancon
Affiliation:
Catalonia Institute for Energy Research (IREC), United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 180 - 181
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Portions of this research were supported through the National Institute of Standards and Technology Award 70NANB18H275. The Raman imaging – SEM/FIB instrument used for some of the specimen preparation was acquired through the support of the National Science Foundation (DMR-1828454).Google Scholar