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Nanoscale Photocurrent Microscopy for Thin Film Solar Cells Using Focused Electron Beam and Near-Field Optical Excitations

Published online by Cambridge University Press:  23 September 2015

Heayoung P. Yoon
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA
Yohan Yoon
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA
Paul M. Haney
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA
Sangmin An
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA
Joshua Schumacher
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA
Kerry Siebein
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA
Alline Myers
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA
Nikolai B. Zhitenev
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20889, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kumar, S. & Rao, K., Energy Environ. Sci. 7 (2014). p 45.Google Scholar
[2] Yoon, H. P., et al., Solar Energy Mater. Solar Cells 117 (2013).Google Scholar
[3] Poplawsky, J. D., et al., Adv. Energy Mater. 1400454 (2014). p. 499.Google Scholar
[4] Haney, P. M., et al., arXiv:1410.4435v1 2014.Google Scholar