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Nanoscale orientation mapping made easy: a new sample preparation workflow for rapid, large-area TKD analysis

Published online by Cambridge University Press:  30 July 2021

Pat Trimby ,
Iain Anderson ,
John Lindsay ,
Ali Gholinia ,
Timothy Burnett  and
Philip Withers
Pat Trimby
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Iain Anderson
Affiliation:
Oxford Instruments NanoAnalysis, United States
John Lindsay
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Ali Gholinia
Affiliation:
The University of Manchester, Manchester, England, United Kingdom
Timothy Burnett
Affiliation:
The University of Manchester, Manchester, United Kingdom
Philip Withers
Affiliation:
University of Manchester, Manchester, England, United Kingdom

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1596 - 1598
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Sneddon, G., et al., Materials Science and Engineering R: Reports, 110 (2016), p. 1-12.Google Scholar
O'Shea, K. J., et al., Micron, 66 (2014) p. 9-15.Google Scholar
Echlin, M.P. et al. , Current Opinion in Solid State and Materials Science 24 (2020) 100817.CrossRefGoogle Scholar