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Multi-detector STEM-EDS mapping of ion-irradiated nanostructured ferritic alloys

Published online by Cambridge University Press:  09 October 2013

C. Parish
Affiliation:
R.M. White
Affiliation:
J.M. LeBeau
Affiliation:
Y. Zhang
Affiliation:
M.K. Miller
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013