Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T22:45:50.192Z Has data issue: false hasContentIssue false
  • English
  • Français

Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography

Published online by Cambridge University Press:  22 July 2022

Kejian Qu ,
Hrishikesh Bale ,
Zachary W. Riedel ,
Junehu Park ,
Leilei Yin ,
André Schleife  and
Daniel P. Shoemaker
Kejian Qu
Affiliation:
Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Hrishikesh Bale*
Affiliation:
ZEISS Research Microscopy Solutions, Inc. Dublin CA
Zachary W. Riedel
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Junehu Park
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Leilei Yin
Affiliation:
Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL
André Schleife
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL National Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL
Daniel P. Shoemaker*
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
*
*Corresponding author: hrishikesh.bale@zeiss.com
**Corresponding author: dpshoema@illinois.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 278 - 279
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Latturner, SE, Acc. Chem. Res. 51 (2018), p. 40.CrossRefGoogle Scholar
Stock, SR, Int. Mater. Rev. 53 (2008), p. 129.CrossRefGoogle Scholar
Ludwig, W et al. , J. Appl. Crystallogr. 41 (2008), p. 302–309.CrossRefGoogle Scholar
Ludwig, W et al. , Rev. Sci. Instrum. 80 (2009), p. 033905.Google Scholar