Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-27T04:23:22.919Z Has data issue: false hasContentIssue false

Microstructure of Josephson Junctions: Effect on Supercurrent Transport in YBCO Grain Boundary and Barrier Layer Junctions

Published online by Cambridge University Press:  02 July 2020

K. L. Merkle
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439
Y. Huang
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL60439
Get access

Extract

The electric transport of high-temperature superconductors, such as YBa2Cu307-x (YBCO), can be strongly restricted by the presence of high-angle grain boundaries (GB). This weak-link behavior is governed by the macroscopic GB geometry and the microscopic grain boundary structure and composition at the atomic level. Whereas grain boundaries present a considerable impediment to high current applications of high Tc materials, there is considerable commercial interest in exploiting the weak-link-nature of grain boundaries for the design of microelectronic devices, such as superconducting quantum interference devices (SQUIDs). The Josephson junctions which form the basis of this technology can also be formed by introducing artifical barriers into the superconductor. We have examined both types of Josephson junctions by EM techniques in an effort to understand the connection between microstructure/chemistry and electrical transport properties. This knowledge is a valuable resource for the design and production of improved devices.

Type
Spatially-Resolved Characterization of Interfaces in Materials
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Vuchic, B.. Merkle, K. L., Char, K., Buchholz, D. B., Chang, R. P. H., and Marks, L. D., J. Mater. Res. 11 (1996)2429.CrossRefGoogle Scholar
2.Vuchic, B., Merkle, K. L., Baldo, P. M., Dean, K. A., Buchholz, D. B., Chang, R. P. H., Zhang, H., and Marks, L. D., Physica C 270 (1996) 75.CrossRefGoogle Scholar
3.Huang, Y., Merkle, K. L., Lee, L. P., Tepee, M., and Char, K., Appl. Phys. Lett, in print (1998).Google Scholar
4.Huang, Y., Merkle, K. L., and Char, K.. Microscopy and Microanalysis 3 (1997) 108.CrossRefGoogle Scholar
5.Moeckly, B. H. and Char, K., Appl. Phys. Lett. 71(1997) 2526.CrossRefGoogle Scholar
6. The authors acknowledge the use of the facilities of the ANL/MSD Electron Microscopy Center. This work was supported by the U.S. DOE, BES, under contract W-3 l-109-Eng-38 (KLM) and by the NSF under contract #DMR 91-210000 (YH).Google Scholar