Hostname: page-component-68945f75b7-qvshk Total loading time: 0 Render date: 2024-08-06T01:18:03.252Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and Characterization of CuAlNi Shape Memory Thin Films

Published online by Cambridge University Press:  01 August 2002

A.C. Kneissl ,
K. Kutschej  and
X.D. Wu
A.C. Kneissl
Affiliation:
University of Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria
K. Kutschej
Affiliation:
University of Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria
X.D. Wu
Affiliation:
University of Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1320 - 1321
Copyright
Copyright © Microscopy Society of America 2002