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Microstructural Study of Organic Mixed Ionic-Electronic Conductor Thin Films Using 4D-STEM and HRTEM

Published online by Cambridge University Press:  22 July 2022

Yael Tsarfati ,
Karen C. Bustillo ,
Luke Balhorn ,
Tyler J. Quill ,
Jennifer Donohue ,
Steven E. Zeltmann ,
Benjamin Savitzky ,
Colin Ophus ,
Christopher J. Takacs  and
Iain McCulloch
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Yael Tsarfati
Affiliation:
Department of Materials Science and Engineering, Stanford University, CA, USA National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Karen C. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Luke Balhorn
Affiliation:
Department of Materials Science and Engineering, Stanford University, CA, USA
Tyler J. Quill
Affiliation:
Department of Materials Science and Engineering, Stanford University, CA, USA
Jennifer Donohue
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, CA, USA
Steven E. Zeltmann
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, CA, USA
Benjamin Savitzky
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Christopher J. Takacs
Affiliation:
Stanford Synchrotron Radiation Light source, SLAC National Accelerator Laboratory, CA, USA University of Oxford, Department of Chemistry, UK
Iain McCulloch
Affiliation:
University of Oxford, Department of Chemistry, UK
Andrew M. Minor*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Department of Materials Science and Engineering, University of California, Berkeley, CA, USA
Alberto Salleo*
Affiliation:
Department of Materials Science and Engineering, Stanford University, CA, USA
*
*Corresponding authors: asalleo@stanford.edu, aminor@berkeley.edu
*Corresponding authors: asalleo@stanford.edu, aminor@berkeley.edu

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 350 - 351
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Copyright
Copyright © Microscopy Society of America 2022

References

Paulsen, B. D. et al. Nat. Mater. 19 (2020), p. 13. doi: 10.1038/s41563-019-0435-zCrossRefGoogle Scholar
Savitzky, B. H. et al. Microsc. Microanal. 27 (2021), p. 712. doi: 10.1017/S1431927621000477CrossRefGoogle Scholar
Panova, O. et al. Nat. Mater. 18 (2019), p. 860. doi: 10.1038/s41563-019-0387-3CrossRefGoogle Scholar
This work was supported by the Electron Microscopy of Soft Matter Program (KC11BN) and the Molecular Foundry, which are supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH1123Google Scholar