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Microscopy and Modelling to Understand Defects and Phonon Dispersions
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Physical Review Letters 115 (2015) 036402; Journal of Chemical Physics 150 (2019) 16110110.1103/PhysRevLett.115.036402CrossRefGoogle Scholar
Physical Review Letters 117 (2016) 256101; Physical Review Letters 119 (2017) 02740210.1103/PhysRevLett.117.256101CrossRefGoogle Scholar