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Measuring the Mean Inner Potential Of Al2O3 Sapphire Using Off-axis Electron Holography

Published online by Cambridge University Press:  30 July 2020

Amit Kohn ,
Avi Auslender ,
Mahdi Halabi ,
George Levi  and
Oswaldo Diéguez
Amit Kohn
Affiliation:
Tel Aviv University, Tel Aviv, Tel Aviv, Israel
Avi Auslender
Affiliation:
Tel Aviv University, Tel Aviv, Tel Aviv, Israel
Mahdi Halabi
Affiliation:
Ben-Gurion University of the Negev, Beer Sheva, HaDarom, Israel
George Levi
Affiliation:
Tel Aviv University, Tel Aviv, Tel Aviv, Israel
Oswaldo Diéguez
Affiliation:
Tel Aviv University, Tel Aviv, Tel Aviv, Israel

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 420 - 422
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Copyright
Copyright © Microscopy Society of America 2020

References

O'Keeffe, M., Spence, J. C. H., “On the average Coulomb potential (ϕ 0) and constraints on the electron density in crystals”, Acta Crystallographica Section A. 50 (1994) 35–45.Google Scholar
Auslender, Avi, Halabi, Mahdi, Levi, George, Diéguez, Oswaldo, Amit Kohn “Measuring the mean inner potential of Al2O3 sapphire using off-axis electron holography”, Ultramicroscopy. 198, 18–25 (2019).10.1016/j.ultramic.2018.12.017CrossRefGoogle ScholarPubMed
Peng, L.M., Dudarev, S.L., Whelan, M.J., “Electron scattering factors of ions and dynamical RHEED from surfaces of ionic crystals”, Physical Review B. 57 (1998) 7259–7265.10.1103/PhysRevB.57.7259CrossRefGoogle Scholar