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A Materials Scientist's CANVAS: A System for Controlled Alteration of Nanomaterials in Vacuum Down to the Atomic Scale

Published online by Cambridge University Press:  22 July 2022

Clemens Mangler ,
Jannik Meyer ,
Andreas Mittelberger ,
Kimmo Mustonen ,
Toma Susi  and
Jani Kotakoski
Clemens Mangler*
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jannik Meyer
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria Current affiliation: University of Tuebingen, Institute for Applied Physics, Tuebingen, Germany
Andreas Mittelberger
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria Current affiliation: Nion Co., Kirkland, WA, USA
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Toma Susi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
*
*Corresponding author: clemens.mangler@univie.ac.at

Abstract

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Type
Microscopy Infrastructures: Architectures, Avenues and Access
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2940 - 2942
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Copyright
Copyright © Microscopy Society of America 2022

References

Hotz, MT et al., Microscopy and Microanalysis 22(S3) (2016), p. 34. doi:10.1017/S1431927616001021CrossRefGoogle Scholar
Krivanek, OL et al. , Ultramicroscopy 108(3) (2008), p. 179. doi:10.1016/j.ultramic.2007.07.010CrossRefGoogle Scholar
GETec Microscopy, https://www.getec-afm.com/afsem/ (accessed Feb. 18, 2022)Google Scholar
SPECS, https://www.specs-group.com/nc/specs/products/detail/mps-ecr-an/ (accessed Feb. 18, 2022)Google Scholar
Riber products, https://www.riber.com/product/s40-st-hl-cl-dz-series/ (accessed Feb. 18, 2022)Google Scholar
FOCUS EFM3, https://www.focus-gmbh.com/efm-evaporators/efm-3/ (accessed Feb. 18, 2022)Google Scholar
Lastertack, https://lasertack.com/en/6w-445nm-laser-diode-nubm44 (accessed Feb. 18, 2022)Google Scholar
MBRAUN Glovebox Workstations, https://www.mbraun.com/en/products/glovebox-workstations.html (accessed Feb. 18, 2022)Google Scholar
Inani, H et al. , The Journal of Physical Chemistry C 123(20) (2019), p. 13136. doi:10.1021/acs.jpcc.9b01894bCrossRefGoogle Scholar
Trentino, A et al. , Nano Letters 21(12) (2021), p. 5179. doi:10.1021/acs.nanolett.1c01214CrossRefGoogle Scholar
Leuthner, GT et al. , 2D Materials 8(3) (2021), p. 035023. doi:10.1088/2053-1583/abf624CrossRefGoogle Scholar
Mustonen, K et al. , Advanced Materials (2022), p. 2106922. doi:10.1002/adma.202106922CrossRefGoogle Scholar
Hofer, C et al. , Nature Communications 10 ( 2019), p. 4570. doi:10.1038/s41467-019-12537-3CrossRefGoogle Scholar
Zagler, G et al. , 2D Materials 7(4) (2020), p. 045017. doi:10.1088/2053-1583/ab9c39CrossRefGoogle Scholar
The authors thank V Skákalová for suggesting the name of the system, G Zagler, S Hummel, W Joudi and F Herterich for help with construction. This work was supported by the European Research Council (ERC) Grant No. 336453-PICOMAT. J.K. acknowledges support from the Austrian Science Fund (FWF) through projects I3181-N36 and P31605-N36, and T.S. through project P28322-N36 as well as through the European Research Council (ERC) Grant no. 756277-ATMEN.Google Scholar