Hostname: page-component-84b7d79bbc-rnpqb Total loading time: 0 Render date: 2024-07-29T09:25:09.277Z Has data issue: false hasContentIssue false
  • English
  • Français

Materials Characterization of Thin Films Printed with Ge20Se80 Ink

Published online by Cambridge University Press:  05 August 2019

Al-Amin Ahmed Simon ,
Shah Mohammad Rahmot Ullah ,
Bahareh Badamchi ,
Harish Subbaraman  and
Maria Mitkova
Al-Amin Ahmed Simon*
Affiliation:
Department of Electrical and Computer Engineering/Boise State University, Boise, USA.
Shah Mohammad Rahmot Ullah
Affiliation:
Department of Electrical and Computer Engineering/Boise State University, Boise, USA.
Bahareh Badamchi
Affiliation:
Department of Electrical and Computer Engineering/Boise State University, Boise, USA.
Harish Subbaraman
Affiliation:
Department of Electrical and Computer Engineering/Boise State University, Boise, USA.
Maria Mitkova
Affiliation:
Department of Electrical and Computer Engineering/Boise State University, Boise, USA.
*
*Corresponding author: alaminahmedsimon@u.boisestate.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Characterization of Components Fabricated by Additive Manufacturing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2606 - 2607
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ahmed Simon, A et al. , NPIC & HMIT (2019) in press.Google Scholar
[2]Badamchi, B et al. , NPIC & HMIT (2019) in press.Google Scholar
[3]Kotz, F et al. , Nature 544 (2017), p. 337.Google Scholar