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Mapping the Mesoscale Interface Structure in Polycrystalline Materials

Published online by Cambridge University Press:  02 July 2020

C. T. Wu ,
B. L. Adams ,
C. L. Bauer ,
D. Casasent ,
A. Morawiec ,
S. Ozdemir  and
A. Talukder
C. T. Wu
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA15213
B. L. Adams
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA15213
C. L. Bauer
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA15213
D. Casasent
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA15213
A. Morawiec
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA15213
S. Ozdemir
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA15213
A. Talukder
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA15213
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Extract

Using the new method known as Orientation Imaging Microscopy (OIM), characterization of mesoscale aspect of the internal structure of polycrystalline materials in the two-dimensional section plane has become routine. However, in some applications which primarily focus either on the characterization of interface types or on their connectivity, OIM is rather inefficient since only the scan points that lie adjacent to the interfaces are used to determine interface character. When the OIM grid spacing is dictated by the precision with which the interfacial in-plane inclination must be determined in the section plane, the efficiency with which conventional OIM can harvest interfacial data is rather poor.

In this paper a new approach and system of microscopy is described, called the Mesoscale Interface Mapping System (MIMS). MIMS overcomes the challenges associated with OIM by directing the beam to the vicinity of interfaces which have been identified by a microstructural contrast image.

Type
Electron diffraction in the SEM: automated EBSP and its application
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 260 - 261
Copyright
Copyright © Microscopy Society of America

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References

references

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6. This work was supported primarily by the MRSEC Program of the National Science Foundation under Award Number DMR-9632556Google Scholar