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Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF

Published online by Cambridge University Press:  01 August 2018

Jeff Gelb ,
Benjamin Stripe ,
Xiaolin Yang ,
Sylvia Lewis ,
SH Lau  and
Wenbing Yun
Jeff Gelb
Affiliation:
Sigray, Inc., Concord, CA, USA
Benjamin Stripe
Affiliation:
Sigray, Inc., Concord, CA, USA
Xiaolin Yang
Affiliation:
Sigray, Inc., Concord, CA, USA
Sylvia Lewis
Affiliation:
Sigray, Inc., Concord, CA, USA
SH Lau
Affiliation:
Sigray, Inc., Concord, CA, USA
Wenbing Yun
Affiliation:
Sigray, Inc., Concord, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1058 - 1059
Copyright
© Microscopy Society of America 2018 

References

[1] Merkle, A P Gelb, J Microscopy Today 21 2013) p. 10–15.Google Scholar
[2] Arai, T in Handbook of Practical X-Ray Fluorescence Analysis (ed. B Beckhoff, B Kanngießer, N Langhoff, R Wedell and H Wolff Springer Heidelberg p. 1–26.Google Scholar