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Mapping metal/insulator nanodomains switching in V2O3 by variable-temperature electron spectromicroscopy investigations

Published online by Cambridge University Press:  30 July 2021

Ibrahim Koita
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Xiaoyan Li
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, Ile-de-France, United States
Luiz H. G. Tizei
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, France
Jean-Denis Blazit
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Nathalie Brun
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Etienne Janod
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Julien Tranchant
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Benoît Corraze
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Laurent Cario
Affiliation:
Institut des Matériaux Jean Rouxel (IMN), Université de Nantes, CNRS, 2 Rue de la Houssinière, 44322Nantes, France, United States
Marcel Tencé
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, ORSAY, France
Odile Stéphan
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States
Laura Bocher
Affiliation:
Université Paris-Saclay, CNRS, Laboratoire de Physique des Solides, 91405, Orsay, France, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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