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Low-Voltage (40 kV) Aberration-Corrected, Monochromated, Imaging for Carbon Nanostructures

Published online by Cambridge University Press:  08 April 2017

D Bell ,
D Kolmykov  and
C Russo
D Bell
Affiliation:
Harvard University
D Kolmykov
Affiliation:
Carl Zeiss NTS
C Russo
Affiliation:
Harvard University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1490 - 1491
Copyright
Copyright © Microscopy Society of America 2011