Hostname: page-component-76fb5796d-vfjqv Total loading time: 0 Render date: 2024-04-26T19:40:45.250Z Has data issue: false hasContentIssue false

Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations

Published online by Cambridge University Press:  01 August 2018

Eliska Mikmekovâ
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ales Patâk
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ilona Mullerovâ
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ludëk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Benjamin Daniel
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Ivo Konvalina
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Tomâs Rihâcek
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Martin Zouhar
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments CAS, v.v.i., Brno, Czech Republic.
Anna Zaporozchenko
Affiliation:
Institute of Physics, University of Mainz, Mainz, Germany
Michael Lejeune
Affiliation:
Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, Amiens, France.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Bhimanapati, G R, et al, ACS Nano 9 2015) p. 11509.Google Scholar
[2] Drouin, D, et al, Scanning 29 2007) p. 92.Google Scholar
[3] Giannozzi, P, et al, Journal of Physics: Condensed Matter 21 2009) p. 395502.Google Scholar
[4] Corso, A Dal Computational Materials Science 95 2014) p. 337.Google Scholar
[5] McClain, J Doctoral dissertation, University of New Hampshire (2015).Google Scholar
[6] The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118).Google Scholar