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Low Accelerating Voltage X-ray Microanalysis - Strategies and challenges

Published online by Cambridge University Press:  23 September 2015

Peter McSwiggen
Peter McSwiggen*
Affiliation:
McSwiggen & Associates / JEOL USA, Inc., St. Anthony, MN, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 679 - 680
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] McSwiggen, P, IOP Conf. Series: Materials Science and Engineering 55 (2014).Google Scholar
[2] Armstrong, JT AGU Fall Meeting, San Francisco, Calif. 2011). abstract V31C-2538..Google Scholar
[3] Armstrong, JT, et al, Microscopy and Analysis 27(7) (2013). p. 20–24.Google Scholar