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Locating the 'missing wedge' artifacts from limited-angle CT reconstruction

Published online by Cambridge University Press:  10 August 2018

Jianhong Liu
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Yong Guan*
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Liang Chen
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Haobo Bai
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Wenbin Wei
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Yangchao Tian
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
Gang Liu
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui, People's Republic of China
*
*Yong Guan, yongg @ustc.edu.cn

Abstract:

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'Missing wedge' problem exists in some kind of CT imaging situations, such as electron microscopy, x-ray nano-CT image, etc. Method such as iterative reconstruction algorithms, total variation based method were applied to improve the reconstruction quality, but the 'missing wedge' artifacts are still inevitable. In this paper, a method based on image processing technique was proposed to locate the 'missing wedge' artifacts in CT reconstruction. The result showed good performance on locating the artifacts, which also showed the potential in CT reconstruction and image analysis in nano-CT.

Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Zhuge, X, et al, Ultramicroscopy 175 2017 8796.Google Scholar
[4] Batenburg, K, et al, Ieee Transactions on Image Processing 20 2011 25422553.CrossRefGoogle Scholar
[5] van Aarle, W, et al, Ieee Transactions on Image Processing 21 2012 46084621.CrossRefGoogle Scholar
[6] Zhuge, X, et al, Ieee Transactions on Image Processing 25 2016 455468.CrossRefGoogle Scholar
[7] Liang, Z, et al, Journal of Synchrotron Radiation 23 2016 606616.CrossRefGoogle Scholar