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Linking Length Scales and Modalities with Integrated, Correlative Microscopy

Published online by Cambridge University Press:  25 July 2016

Jeff Gelb ,
Will Harris ,
Lorenz Lechner  and
Arno Merkle
Jeff Gelb
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
Will Harris
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
Lorenz Lechner
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA
Arno Merkle
Affiliation:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 238 - 239
Copyright
© Microscopy Society of America 2016 

References

[1] Merkle, A P & Gelb, J Microscopy Today (2013). pp. 10–15.CrossRefGoogle Scholar
[2] Merkle, A P, et al, Microscopy and Analysis (2014). pp. S10–S13.Google Scholar