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LA-WATAP and SIMS as Complementary Techniques for Quantitative Measurement of Nnanometer Structures

  • L Renaud (a1), I Martin (a1), A Merkulov (a1), P Peres (a1), R Benbalagh (a1) and M Schuhmacher (a1)...

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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