Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-25T11:59:53.153Z Has data issue: false hasContentIssue false
  • English
  • Français

Latest Generation of Silicon Drift Detectors and Readout Electronics

Published online by Cambridge University Press:  05 August 2019

Andreas Pahlke ,
Florian Dams ,
Reinhard Fojt ,
Michael Fraczek ,
Jürgen Knobloch ,
Christian Luckey ,
Natsuki Miyakawa  and
Niklas Willems
Andreas Pahlke
Affiliation:
KETEK GmbH, Munich, Germany.
Florian Dams
Affiliation:
KETEK GmbH, Munich, Germany.
Reinhard Fojt
Affiliation:
KETEK GmbH, Munich, Germany.
Michael Fraczek
Affiliation:
KETEK GmbH, Munich, Germany.
Jürgen Knobloch
Affiliation:
KETEK GmbH, Munich, Germany.
Christian Luckey
Affiliation:
KETEK GmbH, Munich, Germany.
Natsuki Miyakawa
Affiliation:
KETEK GmbH, Munich, Germany.
Niklas Willems
Affiliation:
KETEK GmbH, Munich, Germany.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 558 - 559
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Huebner, S et al. , IEEE Trans. Nucl. Sci. 62 (2) (2015), p. 588.Google Scholar
[2]Huebner, S et al. , Phys. Status Solidi B 252 (11) (2015), p. 2564.Google Scholar