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Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens

Published online by Cambridge University Press:  05 August 2019

Takehito Seki ,
Yuichi Ikuhara  and
Naoya Shibata
Takehito Seki
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan Nanostructure Research Laboratory, Japan Fine Ceramic Center, Nagoya, Japan
Naoya Shibata*
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan Nanostructure Research Laboratory, Japan Fine Ceramic Center, Nagoya, Japan
*
*Corresponding author: shibata@sigma.t.u-tokyo.ac.jp

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 60 - 61
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Shibata, N. et al. , Nature Physics 8 (2012) 611.Google Scholar
[2]Shibata, N. et al. , Nature Communications 8 (2017) 15631.Google Scholar
[3]Ishikawa, R. et al. , Nature Communications 9 (2018) 3878.Google Scholar
[4]Shibata, N. et al. , Accounts of Chemical Research 50 (2017) 1502.Google Scholar
[5]Sánchez-Santolino, G. et al. , ACS Nano 12 (2018) 8875.Google Scholar
[6]Seki, T. et al. , Ultramicroscopy 182 (2017) 258.Google Scholar
[7]Waddell, E. et al. , Optik 54 (1979) 83.Google Scholar
[8]Müller, K. et al. , Nature Communications 5 (2014) 5653.Google Scholar
[9]Seki, T., Takanashi, N. and Abe, E., Ultramicroscopy 194 (2018) 193.Google Scholar
[10]This work was supported by the SENTAN, Japan Science and Technology Agency, and the JSPS KAKENHI Grant number JP17H01316.Google Scholar