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Is there a Road Map of Aberration Correction towards Ultra-High Rsolution in TEM and STEM?

Published online by Cambridge University Press:  01 August 2005

M Haider  and
H Mueller
M Haider
Affiliation:
CEOS GmbH, Germany
H Mueller
Affiliation:
CEOS GmbH, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 546 - 547
Copyright
© 2005 Microscopy Society of America