Hostname: page-component-7479d7b7d-t6hkb Total loading time: 0 Render date: 2024-07-10T22:32:04.084Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of Elemental Composition and Bonding Structure at the Sb-doped Ni-FUSI/SiO2 interface

Published online by Cambridge University Press:  01 August 2010

N Kawasaki ,
N Sugiyama ,
Y Otsuka  and
H Hashimoto
N Kawasaki
Affiliation:
Toray Research Center Inc, Japan
N Sugiyama
Affiliation:
Toray Research Center Inc, Japan
Y Otsuka
Affiliation:
Toray Research Center Inc, Japan
H Hashimoto
Affiliation:
Toray Research Center Inc, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1506 - 1507
Copyright
Copyright © Microscopy Society of America 2010