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Interpretation of meV Resolution Phonon EELS Data

Published online by Cambridge University Press:  01 August 2018

P.E. Batson
Affiliation:
Department of Physics and Astronomy, Rutgers University, NJ, USA
M.J. Lagos
Affiliation:
Department of Materials Science and Engineering, McMaster University, Ontario, Canada

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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