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Interfacial And Surface Study Of Mo-Au And Al-Ag Bilayers For Si-Based Photodetectors

Published online by Cambridge University Press:  02 July 2020

Mary J. Li ,
S. Aslam ,
T.C. Chen ,
F.M. Finkbeiner ,
C. He ,
R.L. Kelley ,
D.B. Mott ,
C.K. Stahle ,
CM. Stahle  and
L. Wang
Mary J. Li
Affiliation:
'Raytheon Corp. STX, Greenbelt, MD20770, USA
S. Aslam
Affiliation:
'Raytheon Corp. STX, Greenbelt, MD20770, USA
T.C. Chen
Affiliation:
Global Science & Technology Inc., Greenbelt, MD20770, USA
F.M. Finkbeiner
Affiliation:
NASA/Goddard Space Flight Center, Code 553, Greenbelt, MD20771, USA
C. He
Affiliation:
Unisys Corp., Lanham, MD20706, USA
R.L. Kelley
Affiliation:
Physics Department, Stanford University, Stanford, CA94305, USA
D.B. Mott
Affiliation:
NASA/Goddard Space Flight Center, Code 553, Greenbelt, MD20771, USA
C.K. Stahle
Affiliation:
Orbital Science Corp., Greenbelt, MD20771, USA
CM. Stahle
Affiliation:
NASA/Goddard Space Flight Center, Code 553, Greenbelt, MD20771, USA
L. Wang
Affiliation:
Unisys Corp., Lanham, MD20706, USA
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Extract

Bilayer thin films have been utilized in superconducting transition-edge sensors (TES) for photodetector development. A TES is formed with a normal metal conductor film and a superconductor film, so called bilayer, deposited on a subtract. In its,transition temperature region, the resistance of the superconductor film is extremely sensitive to the temperature. When an incident radiation ray arrives, the temperature of the bilayer increases, leading the resistance increases tremendously. A superconducting quantum interference device measures the current variation for read-out. By varying the relative thickness of the normal metal conductor layer and the superconductor layer, one can adjust the transition temperature of the bilayer to a desired range according to the proximity effect. TES bilayers are fabricated on Si-based substrates for the development of infrared, ultra-violet, and x-ray detectors.

Various normal and superconducting metal combinations are considered as bilayer candidates. When two metals are brought together, the concerns usually rise to those materials issues that may affect TES performance.

Type
Atomic Structure And Microchemistry Of Interfaces
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 164 - 165
Copyright
Copyright © Microscopy Society of America

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References

Reference:

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