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Integrated Microscopy: Highly Accurate Light-Electron Image Correlation Anywhere on a Sample

Published online by Cambridge University Press:  04 August 2017

M.T. Haring ,
N. Liv ,
A.C. Zonnevylle ,
A.C. Narvaez ,
P. Kruit ,
J.P. Hoogenboom  and
L.M. Voortman
M.T. Haring
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
N. Liv
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
A.C. Zonnevylle
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
A.C. Narvaez
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
P. Kruit
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
J.P. Hoogenboom
Affiliation:
Imaging Physics, Delft University of Technology, Delft, the Netherlands
L.M. Voortman
Affiliation:
Delmic BV, Delft, the Netherlands

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1272 - 1273
Copyright
© Microscopy Society of America 2017 

References

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[6] Liv, N., et al, PLoS ONE 8(2 2013 e55707.CrossRefGoogle Scholar
[7] Haring, M. T., et al, Scientific Reports (in press 2017.Google Scholar
[8] Our integrated microscope served as a prototype for a commercial system by Delmic BV. A. C. Zonnevylle, P. Kruit, and J. P. Hoogenboom are shareholders in Delmic BV.Google Scholar