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Integrated APT/t-EBSD for Grain Boundary Analysis of Thermally Grown Oxide on a Ni-Based Superalloy

Published online by Cambridge University Press:  23 September 2015

Y. Chen ,
K.P. Rice ,
T.J. Prosa ,
E.A. Marquis  and
R.C. Reed
Y. Chen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
K.P. Rice
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
E.A. Marquis
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA
R.C. Reed
Affiliation:
Dept. of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PG, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 687 - 688
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Evans, A., et al., Prog Mater Sci 46 (2001). p. 505.Google Scholar
[2] Chen, Y, et al., Oxidation of Metals 82 (2014). p. 457.Google Scholar
[3] Babinsky, K., et al., Ultramicroscopy 144 (2014). p. 9.Google Scholar