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In-Situ Transmission Electron Microscopy: Electron Beam Effects in Carbon-based Nanomaterials

Published online by Cambridge University Press:  30 July 2021

Zhehan Ying ,
Jiangyong Diao ,
Shi Wang ,
Xiangbin Cai ,
Hongyang Liu  and
Ning Wang
Zhehan Ying
Affiliation:
The Hong Kong University of Science and Technology, Hong Kong, Hong Kong
Jiangyong Diao
Affiliation:
Institute of Metal Research, Chinese Academy of Sciences, United States
Shi Wang
Affiliation:
The Hong Kong University of Science and Technology, Hong Kong
Xiangbin Cai
Affiliation:
The Hong Kong University of Science and Technology, Hong Kong
Hongyang Liu
Affiliation:
Institute of Metal Research, Chinese Academy of Sciences, United States
Ning Wang
Affiliation:
The Hong Kong University of Science and Technology, Hong Kong, Hong Kong

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2110 - 2113
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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We acknowledge the technical support from Materials Characterization and Preparation Facility of The Hong Kong University of Science and Technology and financial assistance from Research Grants Council of Hong Kong (Project No. 16306818 and N_HKUST624/19), National Key R&D Program of China (2016YFA0204100), National Natural Science Foundation of China (91845201, 21961160722, 22072162), Liaoning Revitalization Talents Program (XLYC1907055), Guangxi Key Laboratory of Information Materials Guilin University of Electronic Technology (Project 191005-K) and the Sinopec China.Google Scholar