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In-Situ Study of NiO Growth on Textured Nickel Tape Using Environmental Scanning Electron Microscope (ESEM) and Hot Stage

Published online by Cambridge University Press:  02 July 2020

Y. Akin
Affiliation:
National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL, 32310
R.E. Goddard
Affiliation:
National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL, 32310
W. Sigmund
Affiliation:
Department of Materials Science and Engineering, University of Florida, Gainesville, FL, 32611
Y.S. Hascicek
Affiliation:
National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL, 32310
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Abstract

Deposition of highly textured ReBa2Cu3O7−δ (RBCO) films on metallic substrates requires a buffer layer to prevent chemical reactions, reduce lattice mismatch between metallic substrate and superconducting film layer, and to prevent diffusion of metal atoms into the superconductor film. Nickel tapes are bi-axially textured by cold rolling and annealing at appropriate temperature (RABiTS) for epitaxial growth of YBa2Cu3O7−δ (YBCO) films. As buffer layers, several oxide thin films and then YBCO were coated on bi-axially textured nickel tapes by dip coating sol-gel process. Biaxially oriented NiO on the cube-textured nickel tape by a process named Surface-Oxidation- Epitaxy (SEO) has been introduced as an alternative buffer layer. in this work we have studied in situ growth of nickel oxide by ESEM and hot stage.

Representative cold rolled nickel tape (99.999%) was annealed in an electric furnace under 4% hydrogen-96% argon gas mixture at 1050°C to get bi-axially textured nickel tape.

Type
Oxidation/Corrosion
Copyright
Copyright © Microscopy Society of America 2001

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References

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