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In-Situ Characterization of 2-Dim Materials at High Energy and Spatial Resolution

Published online by Cambridge University Press:  07 February 2019

Jacob R. Jokisaari
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Jordan Hachtel
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Science, Oak Ridge, TN 37831.
Xuan Hu
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Arijita Mukherjee
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Canhui Wang
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.
Andrea Konecna
Affiliation:
Center for Material Physics, Donostia - San Sebastian Gipuzkoa 20018Spain.
Javier Aizpurua
Affiliation:
Center for Material Physics, Donostia - San Sebastian Gipuzkoa 20018Spain.
Ondrej L. Krivanek
Affiliation:
Nion Company, 11511 NE 118th St., Kirkland, WA 98034.
Juan-Carlos Idrobo
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Science, Oak Ridge, TN 37831.
Robert F. Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL 60607.

Abstract

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Type
Studying Material Reactions with In-Situ Spectroscopy
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

**

now at: National Institute of Standards and Technology

References

References:

[1]Standley, B et al. , Nano Lett 8 (2008), 3345.Google Scholar
[2]Wang, C et al. , Appl Mat 26 (2014), 3410.Google Scholar
[3]Hu, X et al. , Phys Rev Lett 120(5) (2018), 055902.Google Scholar
[4]Wang, C et al. , Adv Mat 28(35) (2016), 7716.Google Scholar
[5]Krivanek, OL et al. , Nature 514 (2014), 209.Google Scholar
[6]This work was in part supported by the National Science Foundation (EFMA-1542864 (EFRI)).Google Scholar