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In-Situ and Ex-Situ Characterization of Evolution of Defects in AlGaN/GaN HEMTs under Bias

Published online by Cambridge University Press:  09 October 2013

H. Ghassemi ,
A. Lang ,
C. Johnson ,
R. Wang ,
B. Song ,
H. Xing  and
M. Taheri
H. Ghassemi
Affiliation:
A. Lang
Affiliation:
C. Johnson
Affiliation:
R. Wang
Affiliation:
B. Song
Affiliation:
H. Xing
Affiliation:
M. Taheri
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 452 - 453
Copyright
Copyright © Microscopy Society of America 2013