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Insights into Thermal Degradation of Hot Melt Pressure-Sensitive Adhesive (PSA) with Atomic Force Microscopy - Infrared Spectroscopy (AFM-IR) Analysis

Published online by Cambridge University Press:  22 July 2022

Hu Duan ,
Brian R. Strohmeier  and
Yunli Fang
Hu Duan*
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH, United States
Brian R. Strohmeier
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH, United States
Yunli Fang
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH, United States
*
*Corresponding author: hu.duan@averydennison.com

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2490 - 2491
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Copyright
Copyright © Microscopy Society of America 2022

References

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