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Initiation of Grain Growth Observed Using Electrostatic-Subframing

Published online by Cambridge University Press:  05 August 2019

B.W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
A.M. Monterrosa
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
A.A. Moghadam
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
R.S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
S.T. Park
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
S.A. Briggs
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA Oregon State University, Corvallis, OR 97331, USA
P.M. Price
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
C.M. Barr
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
J.T. McKeown
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94551, USA
D.J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA
K. Hattar*
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
*
*Corresponding author: khattar@sandia.gov

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

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[3]Reed, B.W., et al. , Microsc. Microanal. 23 (Suppl 1), (2017), p. 84Google Scholar
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[6]This work was supported by the US Department of Energy, Office of Basic Energy Sciences. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525. This material is based in part upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award Number DE-SC0013104. SAND2019-1650 CGoogle Scholar