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The Influence of X-ray Counting Statistics on Trace Analysis and Spatial Resolution

Published online by Cambridge University Press:  01 August 2002

Eric Lifshin  and
Raynald Gauvin
Eric Lifshin
Affiliation:
University at Albany, School of Nanosciences and Nanoengineering, Albany, NY, 12203
Raynald Gauvin
Affiliation:
McGill University, Department of Mining, Metals and Materials, Montreal, Quebec, Canada H3A2B2

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 432 - 433
Copyright
Copyright © Microscopy Society of America 2002