Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

P Ercius; DA Muller

doi:10.1017/S1431927609098067

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Van Tendeloo, Gustaaf Bals, Sara Van Aert, Sandra Verbeeck, Jo and Van Dyck, Dirk 2012. Advanced Electron Microscopy for Advanced Materials. Advanced Materials, Vol. 24, Issue. 42, p. 5655.

Bals, Sara Goris, Bart Altantzis, Thomas Heidari, Hamed Van Aert, Sandra and Van Tendeloo, Gustaaf 2014. Seeing and measuring in 3D with electrons. Comptes Rendus Physique, Vol. 15, Issue. 2-3, p. 140.

Printemps, Tony Mula, Guido Sette, Daniele Bleuet, Pierre Delaye, Vincent Bernier, Nicolas Grenier, Adeline Audoit, Guillaume Gambacorti, Narciso and Hervé, Lionel 2016. Self-adapting denoising, alignment and reconstruction in electron tomography in materials science. Ultramicroscopy, Vol. 160, Issue. , p. 23.

Hamngren Blomqvist, C. Gebäck, T. Altskär, A. Hermansson, A.-M. Gustafsson, S. Lorén, N. and Olsson, E. 2017. Interconnectivity imaged in three dimensions: Nano-particulate silica-hydrogel structure revealed using electron tomography. Micron, Vol. 100, Issue. , p. 91.

Gnanasekaran, Karthikeyan de With, Gijsbertus and Friedrich, Heiner 2018. Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials. Royal Society Open Science, Vol. 5, Issue. 5, p. 171838.

Oveisi, E. Spadaro, M.C. Rotunno, E. Grillo, V. and Hébert, C. 2019. Insights into image contrast from dislocations in ADF-STEM. Ultramicroscopy, Vol. 200, Issue. , p. 139.

Ribet, Stephanie M. Murthy, Akshay A. Roth, Eric W. dos Reis, Roberto and Dravid, Vinayak P. 2021. Making the most of your electrons: Challenges and opportunities in characterizing hybrid interfaces with STEM. Materials Today, Vol. 50, Issue. , p. 100.

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Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

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